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        供應(yīng)英國(guó)Ossila材料TFB

        供應(yīng)英國(guó)Ossila材料TFB
        點(diǎn)擊放大
        供應(yīng)數(shù)量:
        4159
        發(fā)布日期:
        2025/10/4
        有效日期:
        2026/4/4
        原 產(chǎn) 地:
        英國(guó)
        已獲點(diǎn)擊:
        4159
        產(chǎn)品報(bào)價(jià):
          [詳細(xì)資料]

        只用于動(dòng)物實(shí)驗(yàn)研究等

        General Information

        CAS number220797-16-0
        Chemical formula(C51H61N)n
        Molecular weight Mw = 40 KDa (PD = 1.75)
        Absorptionλmax 390 nm (in THF)
        Fluorescenceλem 295 nm, 435 nm (in THF)
        HOMO/LUMOHOMO = 5.3 eV, LUMO = 2.3 eV
        SolventsTHF, Toluene and Chloroform
        SynonymsPoly(9,9-dioctylfluorene-alt-N-(4-sec-butylphenyl)-diphenylamine)
        Classification / FamilyHole transport material (HTL), Hole injection material (HIL), Electron blocking material (EBL), OLEDs, Perovskite solar cells, Organic and printed electronics

        Product Details

        Purity>99%
        Melting pointn.a.
        ColourPale yellow powder/fibers

         

        Chemical Structure

        Poly(9,9-dioctylfluorene-alt-N-(4-sec-butylphenyl)-diphenylamine) (TFB)

        Chemical Structure of Poly(9,9-dioctylfluorene-alt-N-(4-sec-butylphenyl)-diphenylamine) (TFB); CAS No. 220797-16-0; Chemical Formula (C51H61N)n.

        Applications

        Poly(9,9-dioctylfluorene-alt-N-(4-sec-butylphenyl)-diphenylamine) (TFB) is a triarylamine based semiconductor with a band gap of 3 eV (HOMO and LUMO levels of 5.3 and 2.3 eV, respectively) and a relatively high hole mobility of 2 ×10-3 cm2 V-1 s-1.

        Due to its low ionisation potential and high hole mobility, TFB serves primarily as hole transport layer (HTL), hole-injection layer (HIL) and electron-blocking layer (EBL) material in organic electronic devices. When built into device as an interface material, TFB as an electron blocking layer will not only reduce the chance of electron leakage, but also reduce the possibility of exciton quenching between the interface of the active layer and charge transport layer (F8BT/MoOx for example).

         

        Device structure                     ITO (120 nm)/PDOT:PSS(50 nm)/TFB (5 nm)/PYGTPA* (75 nm)/PEGPF* (10 nm)/Ca (10 nm)/Al (100 nm) [1]
        ColourDeep blue dellp blue
        Max. luminance         9,242 cd/m2
        Max. Current Efficiency0.85 cd/A
        Bias4.3 V

         


        Device structure                                           

        ITO/c-ZnO (50 nm)/F8BT (80 nm)/MoO(10 nm)/Au (50 nm) [2]

        ITO/c-ZnO (50 nm)/F8BT (80 nm)/TFB (60 nm)/MoO(10 nm)/Au (50 nm) [2]

        ColourGreen greenGreen green
        Max. luminance    9,370 cd/m216,460 cd/m2
        Max. Current Efficiency0.34 cd/A0.93 cd/A
        Bias~ 0.60 V~ 0.87 V


        Device structure                                      

        ITO/ZnO/CsPbI3/TFB (60 nm)/MoO3 (5 nm)/Ag (80 nm) [3]

        Colour                                 Red red
        Max. Luminance206 cd/m2
        Max. EQE5.7%

        *For chemical structure informations please refer to the cited references

         

        Literature and Reviews

        1. All-solution-processed multilayer polymer/dendrimer light emitting diodes, M. Auer-Berger et al., Org. Electronics, 35, 164-170 (2016); http://dx.doi.org/10.1016/j.orgel.2016.04.044.
        2. High Efficiency Composite Metal Oxide-Polymer Electroluminescent Devices: A Morphological and Material Based Investigation, D. Kabra et al., Adv. Mater., 20, 3447–3452 (2008); DOI: 10.1002/adma.200800202.
        3. Highly Efficient Perovskite Nanocrystal Light-Emitting Diodes Enabled by a Universal Crosslinking Method, G. Li et al., adv. Mater., 28, 3528–3534 (2016); DOI: 10.1002/adma.201600064.
        4. A polymer blend approach to fabricating the hole transport layer for polymer light-emitting diodes, H. Yan et al., Appl. Phys. Lett., 84, 3873 (2004); doi: 10.1063/1.1737791.
        5. Spin-cast thin semiconducting polymer interlayer for improving device efficiency of polymer light-emitting diodes, J-S. Kim et al., Appl. Phys. Lett., 87, 023506 (2005); doi: 10.1063/1.1992658.
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